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1

Secondary ion mass spectrometry with cesium ion primary beam and liquid target matrix for analysis of bioorganic compounds

Aberth, William., Straub, Kenneth M., Burlingame, A. L.

Journal:

Analytical Chemistry

Year:

1982

Language:

english

File:

PDF, 674 KB

english, 1982

2

+

Peterson, James R., Aberth, William H., Moseley, John T., Sheridan, J. Roger

Journal:

Physical Review A

Year:

1971

Language:

english

File:

PDF, 569 KB

english, 1971

3

Erratum: Use of a microchannel plate for ion beam tuning of analytical mass spectrometers

Aberth, William H.

Journal:

Review of Scientific Instruments

Year:

1974

Language:

english

File:

PDF, 337 KB

english, 1974

4

Ions by Ar in the 10-600-eV Range

Aberth, William, Lorents, Donald C.

Journal:

Physical Review (Series I)

Year:

1966

Language:

english

File:

PDF, 1.15 MB

english, 1966

5

An imaging detector system for mass spectrometry

Journal:

International Journal of Mass Spectrometry and Ion Physics

Year:

1981

Language:

english

File:

PDF, 245 KB

english, 1981

6

High mass analysis capability of a wien spectrometer

Journal:

International Journal of Mass Spectrometry and Ion Processes

Year:

1986

Language:

english

File:

PDF, 213 KB

english, 1986

7

Characteristics of a volcano field ionization source mass spectrometer operating at 30 kV accelerating voltage

Journal:

Biological Mass Spectrometry = Journal of Mass Spectrometry (Wiley)

Year:

1980

Language:

english

File:

PDF, 499 KB

english, 1980

8

Use of a microchannel plate for ion beam tuning of analytical mass spectrometers

Aberth, William H.

Journal:

Review of Scientific Instruments

Year:

1974

Language:

english

File:

PDF, 357 KB

english, 1974

9

Mutual Neutralization Cross Section Obtained with Superimposed Beams

Moseley, John, Aberth, William, Peterson, James R.

Journal:

Physical Review Letters

Year:

1970

Language:

english

File:

PDF, 911 KB

english, 1970

10

Field Ionization Mass Spectrometry: A New Tool for the Analytical Chemist

Anbar, Michael, Aberth, William H.

Journal:

Analytical Chemistry

Year:

1974

Language:

english

File:

PDF, 2.87 MB

english, 1974

11

Effect of primary beam energy on the secondary-ion sputtering efficiency of liquid secondary-ionization mass spectrometry in the 5-30-keV range

Aberth, William H., Burlingame, A. L.

Journal:

Analytical Chemistry

Year:

1988

Language:

english

File:

PDF, 321 KB

english, 1988

12

Instrumental conditions of secondary ion mass spectrometry that affect sensitivity for observation of very high masses

Aberth, William.

Journal:

Analytical Chemistry

Year:

1986

Language:

english

File:

PDF, 592 KB

english, 1986

13

Characteristics of a volcano field ion quadrupole mass spectrometer

William Aberth, Charles A. Spindt

Journal:

International Journal of Mass Spectrometry and Ion Physics

Year:

1977

Language:

english

File:

PDF, 1.92 MB

english, 1977

14

Two-body mutual neutralization rates of O 2+ + O − , NO + + O − , and Na + + O − obtained with merged beams

Moseley, John T., Aberth, William, Peterson, James R.

Journal:

Journal of Geophysical Research

Year:

1972

Language:

english

File:

PDF, 300 KB

english, 1972

15

Field ionization mass spectrometry. New tool for the analytical chemist

Anbar, Michael, Aberth, William H.

Journal:

Analytical Chemistry

Year:

1974

Language:

english

File:

PDF, 5.39 MB

english, 1974

16

Evidence for isoaspartyl1 (deamidated) forms of mouse epidermal growth factor

Richard P. DiAugustine, Bradford W. Gibson, William Aberth, Mary Kelly, Carol M. Ferrua, Yasuhiro Tomooka, Charles F. Brown, Michael Walker

Journal:

Analytical Biochemistry

Year:

1987

Language:

english

File:

PDF, 1013 KB

english, 1987

17

Comment on ’’Existence of H 2− , a relatively long‐lived doubly charged negative atomic hydrogen ion’’

Aberth, William

Journal:

The Journal of Chemical Physics

Year:

1976

Language:

english

File:

PDF, 310 KB

english, 1976

18

in the Range 3-400 eV

Aberth, William, Lorents, Donald C.

Journal:

Physical Review (Series I)

Year:

1969

Language:

english

File:

PDF, 996 KB

english, 1969

19

Ions by He in the 20-600-eV Range

Lorents, Donald C., Aberth, William

Journal:

Physical Review (Series I)

Year:

1965

Language:

english

File:

PDF, 1.36 MB

english, 1965

20

Ion-Ion Mutual Neutralization Cross Sections Measured by a Superimposed Beam Technique

Aberth, William H., Peterson, James R.

Journal:

Physical Review A

Year:

1970

Language:

english

File:

PDF, 502 KB

english, 1970

21

Microchannel plate for surface-induced dissociation in mass spectrometry

Aberth, William.

Journal:

Analytical Chemistry

Year:

1990

Language:

english

File:

PDF, 347 KB

english, 1990

22

Comparison of three geometries for a cesium primary beam liquid secondary ion mass spectrometry source

Aberth, William., Burlingame, A. L.

Journal:

Analytical Chemistry

Year:

1984

Language:

english

File:

PDF, 426 KB

english, 1984

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